光源類型

Light type

氙燈瞬態光源

Xenon lamp

光譜範圍

Spectrum wavelength

300-1200nm

300-1200nm

光源等級

Classfication of light source

光譜匹配度  0.875-1.125 A+

輻照度不均勻度  ≤1% A+

輻照度不穩(wěn)定度  ≤1% A+

Spectral match is 0.875-1.125 , class   A+

Irradiance non-uniformity is ≤1% ,  class   A+

Irradiance instability is ≤1%,  class   A+

輻照度範圍

Irradiance intensity

200W/㎡~1200W/㎡

200W/㎡~1200W/㎡

測試面積

Illumination area

 500*500mm

 可定制其他尺(chǐ)寸(cùn)

 500*500mm

 Other size can be customized

脈衝寬度

Pulse duration

10-100ms ，每1ms步進(jìn)可調

10-100ms, in step of 1ms

重復性精度

Repeatability

≤0.1%

≤0.1%

測試技術

Testing technology

標(biāo)配線性掃描、高級遲滯算法(fǎ)、集成逐次逼近法(fǎ)（SAT）、智(zhì)能(néng)測試法(fǎ)（IAT）、峰值保持(chí)測試功能(néng)

It is equipped with linear scanning ,  advanced magnetic hysteresis, successive approximation testing(SAT),  Intelligent testing (IAT) and peak holding test function.

測試電池

Measurable cell type

Perc 、 Topcon、BC
、異質結(jié)等高容性電池組(zǔ)件(jiàn)

PERC, TopCon, BC , HJT and other high capacitance solar modules.

可增配項

Optional service

 EL測試系統，實(shí)現(xiàn)同工位IV/EL測試

 集成IR紅外(wài)熱像儀 ，實(shí)現(xiàn)熱斑測試

 WPVS電池 ，實(shí)現(xiàn)絕對(duì)測量(liàng)

 低輻照度濾鏡，實(shí)現(xiàn)低輻照度測試

 EL testing system, to achieve IV testing

and EL testing at a same section.

 Integrated IR infrared thermal imager to

realize heat spot testing

 WPVS battery , to achieve absolute

measurement.

 Equip with optical filter for low

irradiance test